Language:EN

Wafer measuring equipment

Alignment measurement of overlay in semiconductor production

High sensitivity、Process adaptability、Superior CoO、User-friendly、Factory automation

CharacteristicScene

High sensitivity:high performance imaging system with high NA and low aberration are adopted.

Process adaptability:Wide spectrum light source and polarization can be added, which has good process adaptability for FinFET process.

Superior CoO:Ultra-precision high-speed motion platformare coupledwith high performance measurement method.

User-friendly: Automatic measurement mode selection and automatic prescription generation are available, so that prescription generation time ca n greatly saved.

Factory automation: It supportsSECS/GEM SEMI standard, which can fully meet the requirements of factory automation.

    WeChat official account

      • 合肥地址:安徽省合肥市高新区华佗巷469号1号楼
        上海地址:中国(上海)自由贸易试验区祖冲之路899号11栋
        合肥电话:0551-65116087
        上海电话:021-50935077
        Email: admin@yuweitk.com